Topological edge state cavities: simultaneous enhancement of quality factor and free spectral range

Shaoqi Ding; Zhihao Wang; Cuicui Lu

doi:10.1038/s41377-025-02104-5

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Topological edge state cavities: simultaneous enhancement of quality factor and free spectral range

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- Topological edge state cavities: simultaneous enhancement of quality factor and free spectral range
- Light: Science & Applications Vol. 15, Issue 1, Pages: 19-21(2026)
- Affiliations：
  
  Key Laboratory of Advanced Optoelectronic Quantum Architecture and Measurements of the Ministry of Education, Beijing Key Laboratory of Nanophotonics and Ultrafine Optoelectronic Systems, State Key Laboratory of Chips and Systems for Advanced Light Field Display, Center for Interdisciplinary Science of Optical Quantum and NEMS Integration, School of Physics, Beijing Institute of Technology, Beijing 100081, China
- Author bio：
  
  Cuicui Lu (cuicuilu@bit.edu.cn)
- Funds：
- DOI：10.1038/s41377-025-02104-5
  CLC：
- Published Online：02 January 2026，
  
  Published：31 January 2026
- Accepted：
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Ding, S. Q., Wang, Z. H. & Lu, C. C. Topological edge state cavities: simultaneous enhancement of quality factor and free spectral range. Light: Science & Applications, 15, 19-21 (2026).
DOI：

Ding, S. Q., Wang, Z. H. & Lu, C. C. Topological edge state cavities: simultaneous enhancement of quality factor and free spectral range. Light: Science & Applications, 15, 19-21 (2026). DOI： 10.1038/s41377-025-02104-5.

摘要

Abstract

A novel topological edge state cavity has been realized to enhance the quality factor and free-spectral range

simultaneously

which opens avenues for developing robust high-performance photonic integrated devices.

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references

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