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1.Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, Jiangsu Province 210094, China
2.Jiangsu Key Laboratory of Visual Sensing & Intelligent Perception, Nanjing, Jiangsu Province 210094, China
3.State Key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, Taiyuan, Shanxi Province 030051, China
Chao Zuo (zuochao@njust.edu.cn)
Online First:03 January 2026,
Published:28 February 2026
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Wang, B. W., Chen, Q. & Zuo, C. Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields. Light: Science & Applications, 15, 357-359 (2026).
Wang, B. W., Chen, Q. & Zuo, C. Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields. Light: Science & Applications, 15, 357-359 (2026). DOI: 10.1038/s41377-025-02110-7.
A recent study employing high-spatial-resolution photoemission electron microscopy (PEEM) achieved
for the first time
weak-disturbance imaging of the ultra-confined nanoslit mode in a coupled nanowire pair (CNP)
revealing its quasi-three-dimensional field distribution.
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