Fast, faster, and the fastest structured illumination microscopy

Tianyu Zhao; Ming Lei

doi:10.1038/s41377-024-01505-2

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Fast, faster, and the fastest structured illumination microscopy

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- Fast, faster, and the fastest structured illumination microscopy
- Light: Science & Applications Vol. 13, Issue 9, Pages: 1693-1695(2024)
- Affiliations：
  
  MOE Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, School of Physics, Xi'an Jiaotong University, Xi'an 710049, China
- Author bio：
  
  Ming Lei (ming.lei@xjtu.edu.cn)
- Funds：
- DOI：10.1038/s41377-024-01505-2
  CLC：
- Published：30 September 2024，
  
  Published Online：12 August 2024，
- Accepted：
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Zhao, T. Y. & Lei, M. Fast, faster, and the fastest structured illumination microscopy. Light: Science & Applications, 13, 1693-1695 (2024).
DOI：

Zhao, T. Y. & Lei, M. Fast, faster, and the fastest structured illumination microscopy. Light: Science & Applications, 13, 1693-1695 (2024). DOI： 10.1038/s41377-024-01505-2.

摘要

Abstract

Parallel acquisition-readout structured-illumination microscopy (PAR-SIM) was designed for high-speed raw data acquisition. By utilizing an xy-scan galvo mirror set

the raw data is projected onto different areas of the camera

enabling a fundamentally stupendous information spatial-temporal flux.

关键词

Keywords

references

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