1.Sichuan Research Center of New Materials, Institute of Chemical Materials, China Academy of Engineering Physics, Shuangliu, Chengdu, China
2.State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, International Center of Future Science, Jilin University, Changchun, China
Xiaojia Zheng (xiaojia@caep.cn)
Liang Shen (shenliang@jlu.edu.cn)
Published:30 September 2024,
Published Online:23 July 2024,
Received:20 January 2024,
Revised:31 May 2024,
Accepted:02 July 2024
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Dong, S. Y. et al. Bottom-up construction of low-dimensional perovskite thick films for high-performance X-ray detection and imaging. Light: Science & Applications, 13, 1809-1819 (2024).
Dong, S. Y. et al. Bottom-up construction of low-dimensional perovskite thick films for high-performance X-ray detection and imaging. Light: Science & Applications, 13, 1809-1819 (2024). DOI: 10.1038/s41377-024-01521-2.
Quasi-two-dimensional (Q-2D) perovskite exhibits exceptional photoelectric properties and demonstrates reduced ion migration compared to 3D perovskite
making it a promising material for the fabrication of highly sensitive and stable X-ray detectors. However
achieving high-quality perovskite films with sufficient thickness for efficient X-ray absorption remains challenging. Herein
we present a novel approach to regulate the growth of Q-2D perovskite crystals in a mixed atmosphere comprising methylamine (CH
3
NH
2
MA) and ammonia (NH
3
)
resulting in the successful fabrication of high-quality films with a thickness of hundreds of micrometers. Subsequently
we build a heterojunction X-ray detector by incorporating the perovskite layer with titanium dioxide (TiO
2
). The precise regulation of perovskite crystal growth and
the meticulous design of the device structure synergistically enhance the resistivity and carrier transport properties of the X-ray detector
resulting in an ultrahigh sensitivity (29721.4 μC Gy
air
−1
cm
−2
) for low-dimensional perovskite X-ray detectors and a low detection limit of 20.9 nGy
air
s
−1
. We have further demonstrated a flat panel X-ray imager (FPXI) showing a high spatial resolution of 3.6 lp mm
−1
and outstanding X-ray imaging capability under low X-ray doses. This work presents an effective methodology for achieving high-performance Q-2D perovskite FPXIs that holds great promise for various applications in imaging technology.
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