1.State Key Laboratory of Surface Physics, Key Laboratory of Micro- and NanoPhotonic Structures (Ministry of Education) and Department of Physics, Fudan University, 200433 Shanghai, China
2.Department of Electrical Engineering, City University of Hong Kong, Kowloon, Hong Kong SAR, China
3.State Key Laboratory of Terahertz and Millimeter Waves, City University of Hong Kong, Kowloon, Hong Kong SAR, China
4.Institute for Nanoelectronic Devices and Quantum Computing, Fudan University, 200438 Shanghai, China
5.Collaborative Innovation Center of Advanced Microstructures, Nanjing University, 210093 Nanjing, Jiangsu, China
6.Shanghai Research Center for Quantum Sciences, 201315 Shanghai, China
7.Centre for Biosystems, Neuroscience, and Nanotechnology, City University of Hong Kong, Kowloon, Hong Kong SAR, China
8.Institute of Data and Information, Tsinghua Shenzhen International Graduate School, Tsinghua University, 518071 Shenzhen, Guangdong, China
Maoxiong Zhao (maoxzhao@fudan.edu.cn)
Zihan Geng (geng.zihan@sz.tsinghua.edu.cn)
Mu Ku Chen (mkchen@cityu.edu.hk)
Published:30 September 2024,
Published Online:06 August 2024,
Received:30 December 2023,
Revised:18 June 2024,
Accepted:15 July 2024
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Liu, B. W. et al. Metalenses phase characterization by multi-distance phase retrieval. Light: Science & Applications, 13, 1898-1907 (2024).
Liu, B. W. et al. Metalenses phase characterization by multi-distance phase retrieval. Light: Science & Applications, 13, 1898-1907 (2024). DOI: 10.1038/s41377-024-01530-1.
Metalens
characterized by their unique functions and distinctive physical properties
have gained significant attention for their potential applications. To further optimize the performance of metalens
it is necessary to characterize the phase modulation of the metalens. In this study
we present a multi-distance phase retrieval system based on optical field scanning and discuss its convergence and robustness. Our findings indicate that the system is capable of retrieving the phase distribution of the metalens as long as the measurement noise is low and the total length of the scanned light field is sufficiently long. This system enables the analysis of focal length and aberration by utilizing the computed phase distribution. We extend our investigation to measure the phase distribution of the metalens operating in the near-infrared (NIR) spectrum and identify the impact of defects in the sample on the phase. Additionally
we conduct a comparative analysis of the phase distribution of the metalens in air and ethanol and observe the variations in the phase modulation of the metalens in different working mediums. Our system provides a straightforward method for the phase characterization of metalens
aiding in optimizing the metalens design and functionality.
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