Lens-free on-chip 3D microscopy based on wavelength-scanning Fourier ptychographic diffraction tomography

Xuejuan Wu; Ning Zhou; Yang Chen; Jiasong Sun; Linpeng Lu; Qian Chen; Chao Zuo

doi:10.1038/s41377-024-01568-1

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Lens-free on-chip 3D microscopy based on wavelength-scanning Fourier ptychographic diffraction tomography

Original Articles

- Lens-free on-chip 3D microscopy based on wavelength-scanning Fourier ptychographic diffraction tomography
- Light: Science & Applications Vol. 13, Issue 9, Pages: 1964-1979(2024)
- Affiliations：
  
  1.Smart Computational Imaging (SCI) Laboratory, Nanjing University of Science and Technology, No. 200 Xiaolingwei Street, 210094 Nanjing, Jiangsu, China
  2.Smart Computational Imaging Research Institute (SCIRI) of Nanjing University of Science and Technology, 210094 Nanjing, Jiangsu, China
  3.Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense, No. 200 Xiaolingwei Street, 210094 Nanjing, Jiangsu, China
- Author bio：
  
  Qian Chen (chenqian@njust.edu.cn)
  Chao Zuo (zuochao@njust.edu.cn)
- Funds：
- DOI：10.1038/s41377-024-01568-1
  CLC：
- Published：30 September 2024，
  
  Published Online：05 September 2024，
  
  Received：01 March 2024，
  
  Revised：16 July 2024，
  
  Accepted：06 August 2024
- Accepted：
Scan QR Code
Wu, X. J. et al. Lens-free on-chip 3D microscopy based on wavelength-scanning Fourier ptychographic diffraction tomography. Light: Science & Applications, 13, 1964-1979 (2024).
DOI：

Wu, X. J. et al. Lens-free on-chip 3D microscopy based on wavelength-scanning Fourier ptychographic diffraction tomography. Light: Science & Applications, 13, 1964-1979 (2024). DOI： 10.1038/s41377-024-01568-1.

摘要

Abstract

Lens-free on-chip microscopy is a powerful and promising high-throughput computational microscopy technique due to its unique advantage of creating high-resolution images across the full field-of-view (FOV) of the imaging sensor. Nevertheless

most current lens-free microscopy methods have been designed for imaging only two-dimensional thin samples. Lens-free on-chip tomography (LFOCT) with a uniform resolution across the entire FOV and at a subpixel level remains a critical challenge. In this paper

we demonstrated a new LFOCT technique and associated imaging platform based on wavelength scanning Fourier ptychographic diffraction tomography (wsFPDT). Instead of using angularly-variable illuminations

in wsFPDT

the sample is illuminated by on-axis wavelength-variable illuminations

ranging from 430 to 1200 nm. The corresponding under-sampled diffraction patterns are recorded

and then an iterative ptychographic reconstruction procedure is applied to fill the spectrum of the three-dimensional (3D) scattering potential to recover the sample's 3D refractive index (RI) distribution. The wavelength-scanning scheme not only eliminates the need for mechanical motion during image acquisition and precise registration of the raw images but secures a quasi-uniform

pixel-super-resolved imaging resolution across the entire imaging FOV. With wsFPDT

we demonstrate the high-throughput

billion-voxel 3D tomographic imaging results wi

th a half-pitch lateral resolution of 775 nm and an axial resolution of 5.43 μm across a large FOV of 29.85 mm

and an imaging depth of

200 μm. The effectiveness of the proposed method was demonstrated by imaging various types of samples

including micro-polystyrene beads

diatoms

and mouse mononuclear macrophage cells. The unique capability to reveal quantitative morphological properties

such as area

volume

and sphericity index of single cell over large cell populations makes wsFPDT a powerful quantitative and label-free tool for high-throughput biological applications.

关键词

Keywords

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