Ultra-fast light-field microscopy with event detection

Liheng Bian; Xuyang Chang; Hanwen Xu; Jun Zhang

doi:10.1038/s41377-024-01603-1

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Ultra-fast light-field microscopy with event detection

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- Ultra-fast light-field microscopy with event detection
- Light: Science & Applications Vol. 13, Issue 12, Pages: 2868-2871(2024)
- Affiliations：
  
  State Key Laboratory of CNS/ATM & MIIT Key Laboratory of Complex-field Intelligent Sensing, Beijing Institute of Technology, No 5 Zhongguancun South Street, Haidian District, 100081 Beijing, China
- Author bio：
  
  Jun Zhang (zhjun@bit.edu.cn)
- Funds：
- DOI：10.1038/s41377-024-01603-1
  CLC：
- Published Online：07 November 2024，
  
  Published：31 December 2024
- Accepted：
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Bian, L. H. et al. Ultra-fast light-field microscopy with event detection. Light: Science & Applications, 13, 2868-2871 (2024).
DOI：

Bian, L. H. et al. Ultra-fast light-field microscopy with event detection. Light: Science & Applications, 13, 2868-2871 (2024). DOI： 10.1038/s41377-024-01603-1.

摘要

Abstract

The event detection technique has been introduced to light-field microscopy

boosting its imaging speed in orders of magnitude with simultaneous axial resolution enhancement in scattering medium.

关键词

Keywords

references

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