Tsang's resolution enhancement method for imaging with focused illumination

Alexander Duplinskiy; Jernej Frank; Kaden Bearne; A. I. Lvovsky

doi:10.1038/s41377-025-01791-4

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Tsang's resolution enhancement method for imaging with focused illumination

Original Articles

- Tsang's resolution enhancement method for imaging with focused illumination
- Light: Science & Applications Vol. 14, Issue 6, Pages: 1594-1605(2025)
- Affiliations：
  
  Department of Physics, University of Oxford, Oxford OX1 3PU, UK
- Author bio：
  
  Alexander Duplinskiy (al.duplinskiy@gmail.com)
- Funds：
- DOI：10.1038/s41377-025-01791-4
  CLC：
- Received：06 June 2024，
  
  Revised：01 February 2025，
  
  Accepted：17 February 2025，
  
  Published Online：11 April 2025，
  
  Published：30 June 2025
- Accepted：
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Duplinskiy, A. et al. Tsang's resolution enhancement method for imaging with focused illumination. Light: Science & Applications, 14, 1594-1605 (2025).
DOI：

Duplinskiy, A. et al. Tsang's resolution enhancement method for imaging with focused illumination. Light: Science & Applications, 14, 1594-1605 (2025). DOI： 10.1038/s41377-025-01791-4.

摘要

Abstract

A widely tested approach to overcoming the diffraction limit in microscopy without disturbing the sample relies on substituting widefield sample illumination with a structured light beam. This gives rise to confocal

image scanning

and structured illumination microscopy methods. On the other hand

as shown recently by Tsang and others

subdiffractional resolution at the detection end of the microscope can be achieved by replacing the intensity measurement in the image plane with spatial mode demultiplexing. In this work

we study the combined action of Tsang's method with image scanning. We experimentally demonstrate superior lateral resolution and enhanced image quality compared to either method alone. This result paves the way for integrating spatial demultiplexing into existing microscopes

contributing to further pushing the boundaries of optical resolution.

关键词

Keywords

references

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