A framework for spontaneous Brillouin noise: unveiling fundamental limits in Brillouin metrology

Simeng Jin; Shuai Yao; Zhisheng Yang; Zixuan Du; Xiaobin Hong; Marcelo A. Soto; Jingjing Xie; Long Zhang; Fan Yang; Jian Wu

doi:10.1038/s41377-025-02115-2

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A framework for spontaneous Brillouin noise: unveiling fundamental limits in Brillouin metrology

Original Articles

- A framework for spontaneous Brillouin noise: unveiling fundamental limits in Brillouin metrology
- Light: Science & Applications Vol. 15, Issue 2, Pages: 509-525(2026)
- Affiliations：
  
  1.State Key Laboratory of Information Photonics & Optical Communications, Beijing University of Posts and Telecommunications, Beijing, China
  2.Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, China
  3.Department of Electronics Engineering, Universidad Técnica Federico Santa María, Valparaíso, Chile
  4.School of Physical Science and Technology & State Key Laboratory of Advanced Medical Materials and Devices, ShanghaiTech University, Shanghai, China
- Author bio：
  
  Zhisheng Yang (zhisheng.yang@bupt.edu.cn)
  Fan Yang (yang@siom.ac.cn)
- Funds：
- DOI：10.1038/s41377-025-02115-2
  CLC：
- Received：23 June 2025，
  
  Revised：2025-10-21，
  
  Accepted：31 October 2025，
  
  Online First：03 January 2026，
  
  Published：28 February 2026
- Accepted：
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Jin, S. M. et al. A framework for spontaneous Brillouin noise: unveiling fundamental limits in Brillouin metrology. Light: Science & Applications, 15, 509-525 (2026).
DOI：

Jin, S. M. et al. A framework for spontaneous Brillouin noise: unveiling fundamental limits in Brillouin metrology. Light: Science & Applications, 15, 509-525 (2026). DOI： 10.1038/s41377-025-02115-2.

摘要

Abstract

Spontaneous Brillouin scattering (SpBS) enables non-contact probing of mechanical and thermodynamic material properties

underpinning transformative technologies such as distributed optical fiber sensing and high-resolution microscopy. Achieving ultimate precision in these systems demands a fundamental understanding of noise limits. Yet

an intrinsic SpBS noise phenomenon proposed over three decades ago has remained largely unexplored

particularly in metrological contexts. Here

we revisit the physical mechanism and stochastic nature of this long-overlooked noise source

developing a comprehensive analytical framework

validated through dedicated experiments. Crucially

we propose

for the first time

that SpBS noise constitutes a universal and fundamental limit capable of surpassing conventional constraints (e.g.

the shot-noise limit) in spontaneous Brillouin metrological systems

such as imaging

microscopy and sensing. We experimentally demonstrate the SpBS-noise-limited regime in Brillouin imaging and sensing scenarios. This framework establishes a critical foundation for understanding and optimizing the performance of current and future Brillouin-based technologies across a broad range of applications.

关键词

Keywords

references

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