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1.Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 34141, Republic of Korea
2.KAIST Institute for Health Science and Technology, Korea Advanced Institute of Science and Technology, Daejeon 34141, Republic of Korea
3.Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang 37637, Republic of Korea
4.Present address: Department of Applied Physics, Yale University, New Haven 06520 Connecticut, USA
KyeoReh Lee (lee.kyeo@gmail.com)
YongKeun Park (yk.park@kaist.ac.kr)
Received:21 May 2025,
Revised:2025-11-03,
Accepted:04 November 2025,
Online First:24 February 2026,
Published:30 April 2026
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Lee, K. R. et al. Speckle-based X-ray microtomography via preconditioned Wirtinger flow. Light: Science & Applications, 15, 1377-1388 (2026).
Lee, K. R. et al. Speckle-based X-ray microtomography via preconditioned Wirtinger flow. Light: Science & Applications, 15, 1377-1388 (2026). DOI: 10.1038/s41377-025-02118-z.
Three-dimensional quantitative phase imaging has been extensively studied in X-ray microtomography to improve the sensitivity and specificity of measurements
especially for low atomic number materials. However
obtaining quantitative phase images typically requires additional measurements or assumptions
which significantly limit the practical applicability. Here
we present preconditioned Wirtinger flow (PWF) to realize an assumption-free
single-shot
quantitative X-ray microtomography. Accurate phase retrieval is demonstrated using a specialized gradient-based algorithm with an accurate physical model. Partial coherence of the source is taken into account
extending the potential applications to bench-top sources. Improved accuracy and spatial resolution over conventional speckle tracking methods are experimentally demonstrated. The various samples are explored to demonstrate the robustness and versatility of PWF.
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