Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial
Original Article|Updated:2024-09-30
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Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial
Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial
LSA2012年1卷第1期
Affiliations:
1.Institute for microelectronics and microsystems, National Council of Research, Department of Naples, Naples 80131, Italy
2.Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Author bio:
Dr V Mocella, Institute for microelectronics and microsystems, National Council of Research, Department of Naples, Naples 80131, Italy E-mail: vito.mocella@na.imm.cnr.it
Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial[J]. LSA, 2012,1(1).
Dardano, P. et al. Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial. Light: Science & Applications, 1, e42 (2012).
Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial[J]. LSA, 2012,1(1). DOI: 10.1038/lsa.2012.42.
Dardano, P. et al. Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial. Light: Science & Applications, 1, e42 (2012). DOI: 10.1038/lsa.2012.42.
Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial
we present the first experimental evidence of negative dielectric susceptibility in a two-dimensional silicon photonic crystal (PhC) with negative refractive index behavior. In the frequency range in which the effective refractive index
n
eff
is equal to −1
the incident light couples efficiently to the guided modes in the top surface layer of the PhC metamaterial. These modes resemble surface plasmon polariton resonances. This finding was confirmed by ellipsometric measurements
demonstrating the isotropy of the PhC resonances. Such negative index PhC materials may be of use in biosensing applications.
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