1.CNR-IPCF, Istituto per i Processi Chimico Fisici, 98158 Messina, Italy
2.Dipartimento di Fisica e Astronomia, Università di Catania, 95123 Catania, Italy
3.CNR-MATIS IMM, Istituto per la Microelettronica e Microsistemi, 95123 Catania, Italy
4.Dipartimento di Fisica, Università degli Studi di Pavia, 27100 Pavia, Italy
5.Dipartimento di Scienze Matematiche e Informatiche, Scienze Fisiche e Scienze della Terra, Università di Messina, 98166 Messina, Italy
6.Scuola Superiore di Catania, Università di Catania, via Valdisavoia, 9, 95123 Catania, Italy
B Fazio, Email: fazio@ipcf.cnr.it
A Irrera, Email: irrera@ipcf.cnr.it
纸质出版日期:2016-06,
网络出版日期:2016-01-07,
收稿日期:2015-08-02,
修回日期:2015-12-07,
录用日期:2016-01-03
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Strongly enhanced light trapping in a two-dimensional silicon nanowire random fractal array[J]. LSA, 2016,5(2).
Fazio, B. et al. Strongly enhanced light trapping in a two-dimensional silicon nanowire random fractal array. Light: Science & Applications, 5, e16062 (2016).
Strongly enhanced light trapping in a two-dimensional silicon nanowire random fractal array[J]. LSA, 2016,5(2). DOI: 10.1038/lsa.2016.62.
Fazio, B. et al. Strongly enhanced light trapping in a two-dimensional silicon nanowire random fractal array. Light: Science & Applications, 5, e16062 (2016). DOI: 10.1038/lsa.2016.62.
We report on the unconventional optical properties exhibited by a two-dimensional array of thin Si nanowires arranged in a random fractal geometry and fabricated using an inexpensive
fast and maskless process compatible with Si technology. The structure allows for a high light-trapping efficiency across the entire visible range
attaining total reflectance values as low as 0.1% when the wavelength in the medium matches the length scale of maximum heterogeneity in the system. We show that the random fractal structure of our nanowire array is responsible for a strong in-plane multiple scattering
which is related to the material refractive index fluctuations and leads to a greatly enhanced Raman scattering and a bright photoluminescence. These strong emissions are correlated on all length scales according to the refractive index fluctuations. The relevance and the perspectives of the reported results are discussed as promising for Si-based photovoltaic and photonic applications.
light trappingmultiple scatteringRaman enhancementrandom fractalsilicon nanowires
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