1.Photon Science, DESY, Notkestrasse 85, Hamburg 22607, Germany
2.Center for Free-Electron Laser Science, DESY, Notkestrasse 85, Hamburg 22607, Germany
3.Department of Physics, University of Hamburg, Luruper Chaussee 149, Hamburg 22607, Germany
4.Centre for Ultrafast Imaging, Luruper Chaussee 149, Hamburg 22607, Germany
5.National Science Foundation BioXFEL Science and Technology Center, 700 Ellicott Street, Buffalo, NY 14203, USA
6.Department of Physics, Arizona State University, Tempe, AZ 85287, USA
7.Faculty of Physics, University of Bialystok, Ciolkowskiego 1L Str., Bialystok 15-245, Poland
8.National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
9.Alfred-Wegener Institute, Helmholtz Center for Polar and Marine Research, Bussestr. 27, Bremerhaven 27570, Germany
S Bajt, Email: sasa.bajt@desy.de
纸质出版日期:2018,
网络出版日期:2018-03-23,
收稿日期:2017-07-02,
修回日期:2017-11-19,
录用日期:2017-11-20
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X-ray focusing with efficient high-NA multilayer Laue lenses[J]. LSA, 2018,7(2):17162-9.
Bajt, S. et al. X-ray focusing with efficient high-NA multilayer Laue lenses. Light: Science & Applications, 2, 17162 (2018).
X-ray focusing with efficient high-NA multilayer Laue lenses[J]. LSA, 2018,7(2):17162-9. DOI: 10.1038/lsa.2017.162.
Bajt, S. et al. X-ray focusing with efficient high-NA multilayer Laue lenses. Light: Science & Applications, 2, 17162 (2018). DOI: 10.1038/lsa.2017.162.
Multilayer Laue lenses are volume diffraction elements for the efficient focusing of X-rays. With a new manufacturing technique that we introduced
it is possible to fabricate lenses of sufficiently high numerical aperture (NA) to achieve focal spot sizes below 10 nm. The alternating layers of the materials that form the lens must span a broad range of thicknesses on the nanometer scale to achieve the necessary range of X-ray deflection angles required to achieve a high NA. This poses a challenge to both the accuracy of the deposition process and the control of the materials properties
which often vary with layer thickness. We introduced a new pair of materials—tungsten carbide and silicon carbide—to prepare layered structures with smooth and sharp interfaces and with no material phase transitions that hampered the manufacture of previous lenses. Using a pair of multilayer Laue lenses (MLLs) fabricated from this system
we achieved a two-dimensional focus of 8.4 × 6.8 nm
2
at a photon energy of 16.3 keV with high diffraction efficiency and demonstrated scanning-based imaging of samples with a resolution well below 10 nm. The high NA also allowed projection holographic imaging with strong phase contrast over a large range of magnifications. An error analysis indicates the possibility of achieving 1 nm focusing.
multilayer Laue lensesmultilayersptychographyX-ray holographyX-ray optics
Ice GE, Budai JD, Pang JWL. The race to x-ray microbeam and nanobeam science.Science2011;334: 1234–1239..
Maser J, Schmahl G. Coupled wave description of the diffraction by zone plates with high aspect ratios.Opt Common1992;89: 355–362..
Yan HF, Conley R, Bouet N, Chu YS. Hard x-ray nanofocusing by multilayer Laue lenses.J Phys D Appl Phys2014;47: 263001..
Yan YF, Maser J, Macrander A, Shen Q, Vogt Set al. Takagi-Taupin description of x-ray dynamical diffraction from diffractive optics with large numerical aperture.Phys Rev B2007;76: 115438..
Bajt S, Chapman HN, Aquila A, Gullikson E. High-efficiency x-ray gratings with asymmetric-cut multilayers.J Opt Soc Am A2012;29: 216–230..
Bionta RM, Skulina KM, Weinberg J. Hard X-ray sputtered-sliced phase zone plates.Appl Phys Lett1994;64: 945–947..
Kaulich B.Phasenzonenplatten für die Röntgenmikroskopie im Photonenenergieberich von 2-8 keV, Ph. D. thesis Germany: University of Goettingen, 1996.
Kamijo N, Suzuki Y, Takano H, Tamura S, Yasumoto Met al. Microbeam of 100 keV x ray with a sputtered-sliced Fresnel zone plate.Rev Sci Instrum2003;74: 5101–5104..
Tamura S, Yasumoto M, Kamijo N, Suzuki Y, Awaji Met al. Development of a multilayer Fresnel zone plate for high-energy synchrotron radiation X-rays by DC sputtering deposition.J Synchrotron Rad2002;9: 154–159..
Döring F, Robisch AL, Eberl C, Osterhoff M, Ruhlandt Aet al. Sub-5 nm hard x-ray point focusing by a combined Kirkpatrick-Baez mirror and multilayer zone plate.Opt Express2013;21: 19311–19323..
Kang HC, Stephenson GB, Liu C, Conley R, Macrander ATet al. High-efficiency diffractive x-ray optics from sectioned multilayers.Appl Phys Lett2005;86: 151109..
Liu C, Conley R, Macrander AT, Maser J, Kang HCet al. Depth-graded multilayers for application in transmission geometry as linear zone plates.J Appl Phys2005;98: 113519..
Conley R, Bouet N, Chu YS, Huang XJ, Kang HCet al. Multilayer Laue lens: A brief history and current status.Synch Rad News2016;29: 16–20..
Kang HC, Yan HF, Winarski RP, Holt MV, Maser Jet al. Focusing of hard X-rays to 16 nanometers with a multilayer Laue lens.Appl Phys Lett2008;92: 221114..
Huang XJ, Yan HF, Nazaretski E, Conley R, Bouet Net al. 11 nm hard X-ray focus from a large-aperture multilayer Laue lens.Sci Rep2013;3: 3562..
Morgan AJ, Prasciolu M, Andrejczuk A, Krzywinski J, Meents Aet al. High numerical aperture multilayer Laue lenses.Sci Rep2015;5: 9892..
Prasciolu M, Leontowich AFG, Krzywinski J, Andrejczuk A, Chapman HNet al. Fabrication of wedged multilayer Laue lenses.Opt Mater Express2015;5: 748–755..
Bajt S, Prasciolu M, Morgan AJ, Chapman HN, Krzywinski Jet al. One Dimensional Focusing with High Numerical Aperture Multilayer Laue Lens.AIP Conf Proc2016;1696: 020049..
Windt DL, Donguy S, Hailey CJ, Koglin J, Honkimaki Vet al. W/SiC x-ray multilayers optimized for use above 100 keV.Appl Opt2003;42: 2415–2421..
Jensen CP, Madsen KK, Christensen FE. Small d-spacing WC/SiC multilayers for future hard X-ray telescope designs.Exp Astron2005;20: 93–103..
Fernández-Perea M, Pivovaroff MJ, Soufli R, Alameda J, Mirkarimi Pet al. Ultra-short-period WC/SiC multilayer coatings for x-ray applications.Nucl Instrum Methods Phys Res Sect A: Accelerat, Spectr, Detect Assoc Equip2013;710: 114–119..
Bajt S, Stearns DG, Kearney PA. Investigation of the amorphous-to-crystalline transition in Mo/Si multilayers.J Appl Phys2001;90: 1017–1025..
Windt DL. Stress, microstructure, and stability of Mo/Si, W/Si, and Mo/C multilayer films.J Vac Sci Technol A: Vac Surfaces Film2000;18: 980–991..
Meents A, Reime B, Stuebe N, Fischer P, Warmer Met al. Development of an in-vacuum x-ray microscope with cryogenic sample cooling for beamline P11 at PETRA ⅢProceedings of SPIE: X-Ray Nanoimaging: Instruments and Methods. San Diego, California, United States: SPIE, 2013..
Burkhardt A, Pakendorf T, Reime B, Meyer J, Fischer Pet al. Status of the crystallography beamlines at PETRA Ⅲ.Eur Phys J Plus2016;131: 56..
Huang XJ, Yan HF, Harder R, Hwu Y, Robinson IKet al. Optimization of overlap uniformness for ptychography.Opt Express2014;22: 12634–12644..
Nazaretski E, Yan HF, Lauer K, Bouet N, Huang Xet al. Design and performance of an x-ray scanning microscope at the Hard X-ray Nanoprobe Beamline of the NSLS-Ⅱ.J Synchrotron Rad2017;24: 1113–1119..
Nazaretski E, Lauer K, Yan H, Bouet N, Zhou Jet al. Pushing the limits: an instrument for hard X-ray imaging below 20 nm.J Synchrotron Rad2015;22: 336–341..
Nazaretski E, Huang X, Yan H, Lauer K, Conley Ret al. Design and performance of a scanning ptychography microscope.Rev Sci Instrum2014;85: 033707..
Mariani V, Morgan A, Yoon CH, Lane TJ, White TAet al.OnDA: online data analysis and feedback for serial X-ray imaging.J App Cryst2016;49: 1073–1080..
Yan HF, Huang XJ, Bouet N, Zhou J, Nazaretski Eet al. Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges.Opt Express2017;25: 25234–25242..
Thibault P, Dierolf M, Menzel A, Bunk O, David Cet al. High-resolution scanning X-ray diffraction microscopy.Science2008;321: 379–382..
Seiboth F, Schropp A, Scholz M, Wittwer F, Rödel Cet al. Perfect X-ray focusing via fitting corrective glasses to aberrated optics.Nat Common2017;8: 14623..
Wang YX, Yun WB, Jacobsen C. Achromatic Fresnel optics for wideband extreme-ultraviolet and X-ray imaging.Nature2003;424: 50–53..
Chapman HN, Jacobsen C, Williams S. Applications of a CCD detector in scanning transmission x- ray microscope.Rev Sci Instrum1995;66: 1332–1334..
Rodenburg JM, Bates RHT. The theory of super-resolution electron microscopy via Wigner-distribution deconvolution.Phil Trans Roy Soc A: Math Eng Sci1992;339: 521–553..
Chapman HN. Phase-retrieval X-ray microscopy by Wigner-distribution deconvolution.Ultramicrosc1996;66: 153–172..
Howells MR, Beetz T, Chapman HN, Cui C, Holton JMet al. An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy.J Electron Spectr Relat Phenom2009;170: 4–12..
Breedlove JR Jr, Trammell GT. Molecular microscopy: Fundamental limitations.Science1970;170: 1310–1313..
Sayre D, Chapman HN. X-ray microscopy.Acta Cryst A1995;51: 237–252..
Schropp A, Hoppe R, Meier V, Patommel J, Seiboth Fet al. Imaging shock waves in diamond with both high temporal and spatial resolution at an XFEL.Sci Rep2015;5: 11089..
Nugent KA, Paganin D, Gureyev TE. A phase odyssey.Phys Today2001;54: 27–32..
Paganin D, Mayo SC, Gureyev TE, Miller PR, Wilkins SW. Simultaneous phase and amplitude extraction from a single defocused image of a homogeneous object.J Micros2002;206: 33–40..
Gureyev TE, Wilkins SW. On x-ray phase imaging with a point source.J Opt Soc A1998;15: 579–585..
Decelle J, Not F Acantharia.eLS. 2015, 1–10.
Bernstein R, Kling SA, Boltovskoy D South Atlantic Zooplankton In: Boltovoskoy D. ed.Acantharia. Backhuys Publishers. 1999.
Hamm C, Smetacek V Evolution of Primary Producers in the Sea In: Falkowski PG, Knoll AH. eds.Armor: why, when and how. Elsevier Academic Press, 2007.
Spindler M, Beyer K. Distribution, abundance and diversity of Antarctic acantharian cysts.Mar Micropaleontol1990;15: 209–218..
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