Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement

Diana Serrano; Stefan Seeger

doi:10.1038/lsa.2017.66

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Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement

Original Articles

- Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement
- Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement
- LSA 2017年6卷第4期
- Affiliations：
  
  Department of Chemistry, University of Zurich, Wintherthurerstrasse 190, CH-8057 Zurich, Switzerland
- Author bio：
  
  S Seeger, E-mail: sseeger@chem.uzh.ch
- Funds：
- DOI：10.1038/lsa.2017.66
  中图分类号：
- 纸质出版日期：2017-12，
  
  网络出版日期：2017-04-11，
  
  收稿日期：2016-10-24，
  
  修回日期：2017-03-31，
  
  录用日期：2017-04-10
- Accepted：
Scan QR Code
Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement[J]. LSA, 2017,6(4).

Serrano, D. & Seeger, S. Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement. Light: Science & Applications, 6, e17066 (2017).
Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement[J]. LSA, 2017,6(4). DOI： 10.1038/lsa.2017.66.

Serrano, D. & Seeger, S. Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement. Light: Science & Applications, 6, e17066 (2017). DOI： 10.1038/lsa.2017.66.

摘要

Abstract

Raman scattering microscopy is a versatile tool for label-free imaging and molecular fingerprint analysis. Here

we provide the first demonstration that the selective collection of scattered signals exceeding the critical angle for total internal reflection enables surface-confined spontaneous Raman investigations at nanometre resolution. This high-axial selectivity leads to improved signal-to-background ratios

thus making this technique an excellent probe for surface-related molecular specimens. The richness of the spectroscopic information obtained through the supercritical angle Raman (SAR) collection path was proven by comparing its output with that of a parallel far-field collection path. Furthermore

we demonstrated that the proposed SAR technique is a versatile microscopy approach that can be used alone or in combination with amplified Raman modalities such as surface-enhanced resonance Raman scattering.

关键词

Keywords

near-field opticsRaman scatteringsupercritical microscopysurface science

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