Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer

Jörg S. Eismann; Martin Neugebauer; Klaus Mantel; Peter Banzer

doi:10.1038/s41377-021-00663-x

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Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer

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- Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
- Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
- LSA 2021年10卷第12期页码：2342-2348
- Affiliations：
  
  1.Institute of Physics, University of Graz, NAWI Graz, Universitätsplatz 5, 8010 Graz, Austria
  2.Max Planck Institute for the Science of Light, Staudtstr. 2, 91058 Erlangen, Germany
  3.Institute of Optics, Information and Photonics, University Erlangen-Nuremberg, Staudtstr. 7/B2, 91058 Erlangen, Germany
- Author bio：
  
  Peter Banzer (peter.banzer@uni-graz.at)
- Funds：
- DOI：10.1038/s41377-021-00663-x
  中图分类号：
- 纸质出版日期：2021-12-31，
  
  网络出版日期：2021-11-02，
  
  收稿日期：2021-08-09，
  
  修回日期：2021-10-08，
  
  录用日期：2021-10-14
- Accepted：
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Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer[J]. LSA, 2021,10(12):2342-2348.

Eismann, J. S. et al. Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer. Light: Science & Applications, 10, 2342-2348 (2019).
Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer[J]. LSA, 2021,10(12):2342-2348. DOI： 10.1038/s41377-021-00663-x.

Eismann, J. S. et al. Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer. Light: Science & Applications, 10, 2342-2348 (2019). DOI： 10.1038/s41377-021-00663-x.

摘要

Abstract

Measuring the aberrations of optical systems is an essential step in the fabrication of high precision optical components. Such a characterization is usually based on comparing the device under investigation with a calibrated reference object. However

when working at the cutting-edge of technology

it is increasingly difficult to provide an even better or well-known reference device. In this manuscript we present a method for the characterization of high numerical aperture microscope objectives

functioning without the need of calibrated reference optics. The technique constitutes a nanoparticle

acting as a dipole-like scatterer

that is placed in the focal volume of the microscope objective. The light that is scattered by the particle can be measured individually and serves as the reference wave in our system. Utilizing the well-characterized scattered light as nearly perfect reference wave is the main idea behind this manuscript.

关键词

Keywords

references

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