Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer

Andrew Grieco

doi:10.1038/s41377-024-01574-3

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Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer

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- Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer
- Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer
- LSA 2024年13卷第12期页码：2863-2865
- Affiliations：
  
  Qualcomm Institute, University of California San Diego, 9500 Gilman Dr, La Jolla, CA 92093, USA
- Author bio：
  
  Andrew Grieco (agrieco@ucsd.edu)
- Funds：
- DOI：10.1038/s41377-024-01574-3
  中图分类号：
- 网络出版日期：2024-10-19，
  
  纸质出版日期：2024-12-31
- Accepted：
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Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer[J]. LSA, 2024,13(12):2863-2865.

Grieco, A. Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer. Light: Science & Applications, 13, 2863-2865 (2024).
Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer[J]. LSA, 2024,13(12):2863-2865. DOI： 10.1038/s41377-024-01574-3.

Grieco, A. Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer. Light: Science & Applications, 13, 2863-2865 (2024). DOI： 10.1038/s41377-024-01574-3.

摘要

Abstract

A novel dual-mode optical vector spectrum analyzer is demonstrated that is suitable for the characterization of both passive devices as well as active laser sources. It can measure loss

phase response

and dispersion properties over a broad bandwidth

with high resolution and dynamic range.

关键词

Keywords

references

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