Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry

Sina M. Koehlenbeck; Lance Lee; Mario D. Balcazar; Ying Chen; Vincent Esposito; Jerry Hastings; Matthias C. Hoffmann; Zhirong Huang; May-Ling Ng; Saxon Price; Takahiro Sato; Matthew Seaberg; Yanwen Sun; Adam White; Lin Zhang; Brian Lantz; Diling Zhu

doi:10.1038/s41377-025-01774-5

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Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry

Original Articles

- Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry
- Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry
- LSA 2025年14卷第5期页码：1312-1323
- Affiliations：
  
  1.Edward L. Ginzton Laboratory, Stanford University, Stanford, CA 94305, USA
  2.Linac Coherent Light Source, SLAC National Accelerator Laboratory, Stanford, CA 94309, USA
  3.Department of Applied Physics, Stanford University, Stanford, CA 94305, USA
- Author bio：
  
  Sina M. Koehlenbeck (sina.koehlenbeck@stanford.edu)
  Diling Zhu (dlzhu@slac.stanford.edu)
- Funds：
- DOI：10.1038/s41377-025-01774-5
  中图分类号：
- 收稿日期：2024-08-01，
  
  修回日期：2025-01-24，
  
  录用日期：2025-01-31，
  
  网络出版日期：2025-03-20，
  
  纸质出版日期：2025-05-31
- Accepted：
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Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry[J]. LSA, 2025,14(5):1312-1323.

Koehlenbeck, S. M. et al. Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry. Light: Science & Applications, 14, 1312-1323 (2025).
Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry[J]. LSA, 2025,14(5):1312-1323. DOI： 10.1038/s41377-025-01774-5.

Koehlenbeck, S. M. et al. Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry. Light: Science & Applications, 14, 1312-1323 (2025). DOI： 10.1038/s41377-025-01774-5.

摘要

Abstract

The past decades have witnessed the development of new X-ray beam sources with brightness growing at a rate surpassing Moore's law. Current and upcoming diffraction limited and fully coherent X-ray beam sources

including multi-bend achromat based synchrotron sources and high repetition rate X-ray free electron lasers

puts increasingly stringent requirements on stability and accuracy of X-ray optics systems. Parasitic motion errors at sub-micro radian scale in beam transport and beam conditioning optics can lead to significant loss of coherence and brightness delivered from source to experiment. To address this challenge

we incorporated optical metrology based on interferometric length and angle sensing and real-time correction as part of the X-ray optics motion control system. A prototype X-ray optics system was constructed following the optical layout of a tunable X-ray cavity. On-line interferometric metrology enabled dynamical feedback to a motion control system to track and compensate for motion errors. The system achieved sub-microradian scale performance

as multiple optical elements are synchronously and continuously adjusted. This first proof of principle measurement demonstrated both the potential and necessity of incorporating optical metrology as part of the motion control architecture for large scale X-ray optical systems such as monochromators

delay lines

and in particular

X-ray cavity systems to enable the next generation cavity-based X-ray free electron lasers.

关键词

Keywords

references

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