Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields

Bowen Wang; Qian Chen; Chao Zuo

doi:10.1038/s41377-025-02110-7

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Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields

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- Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields
- Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields
- Light: Science & Applications 2026年15卷第2期页码：357-359
- Affiliations：
  
  1.Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, Jiangsu Province 210094, China
  2.Jiangsu Key Laboratory of Visual Sensing & Intelligent Perception, Nanjing, Jiangsu Province 210094, China
  3.State Key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, Taiyuan, Shanxi Province 030051, China
- Author bio：
  
  Chao Zuo (zuochao@njust.edu.cn)
- Funds：
- DOI：10.1038/s41377-025-02110-7
  中图分类号：
- 网络首发：2026-01-03，
  
  纸质出版：2026-02-28
- Accepted：
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Bowen Wang, Qian Chen, Chao Zuo. Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields[J]. Light: Science & Applications, 2026,15(2):357-359.

Wang, B. W., Chen, Q. & Zuo, C. Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields. Light: Science & Applications, 15, 357-359 (2026).
Bowen Wang, Qian Chen, Chao Zuo. Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields[J]. Light: Science & Applications, 2026,15(2):357-359. DOI： 10.1038/s41377-025-02110-7.

Wang, B. W., Chen, Q. & Zuo, C. Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields. Light: Science & Applications, 15, 357-359 (2026). DOI： 10.1038/s41377-025-02110-7.

摘要

Abstract

A recent study employing high-spatial-resolution photoemission electron microscopy (PEEM) achieved

for the first time

weak-disturbance imaging of the ultra-confined nanoslit mode in a coupled nanowire pair (CNP)

revealing its quasi-three-dimensional field distribution.

关键词

Keywords

references

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