TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering

Ke-Jin Zhou; Qiushi Huang; Mirian Garcia-Fernandez; Yeqi Zhuang; Stefano Agrestini; Shengyou Wen; Thomas Rice; Sahil Tippireddy; Jaewon Choi; Andrew Walters; Igor V. Kozhevnikov; Zhe Zhang; Runze Qi; Zhong Zhang; Hongchang Wang; Zhanshan Wang

doi:10.1038/s41377-025-02172-7

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TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering

Original Articles

- TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering
- TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering
- Light: Science & Applications 2026年15卷第3期页码：824-834
- Affiliations：
  
  1.Diamond Light Source, Harwell Campus, Didcot OX11 0DE, United Kingdom
  2.Key Laboratory of Advanced Micro-Structured Materials, Ministry of Education, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
  3.Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications, Tongji University, Shanghai 200092, China
  4.Shanghai Frontiers Science Center of Digital Optics, Tongji University, Shanghai 200092, China
  5.Zhejiang Tongyue Optical Technology Co. Ltd, Huzhou 313100, China
  6.Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, China
  7.Present address: National Synchrotron Radiation Laboratory and School of Nuclear Science and Technology, University of Science and Technology of China, Hefei 230026, China
- Author bio：
  
  Ke-Jin Zhou (kjzhou@ustc.edu.cn)
  Qiushi Huang (huangqs@tongji.edu.cn)
  Hongchang Wang (hongchang.wang@diamond.ac.uk)
  Zhanshan Wang (wangzs@tongji.edu.cn)
- Funds：
- DOI：10.1038/s41377-025-02172-7
  中图分类号：
- 收稿：2025-05-12，
  
  修回：2025-11-22，
  
  录用：2025-12-15，
  
  网络首发：2026-01-21，
  
  纸质出版：2026-03-31
- Accepted：
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Ke-Jin Zhou, Qiushi Huang, Mirian Garcia-Fernandez, 等. TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering[J]. Light: Science & Applications, 2026,15(3):824-834.

Zhou, K. J. et al. TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering. Light: Science & Applications, 15, 824-834 (2026).
Ke-Jin Zhou, Qiushi Huang, Mirian Garcia-Fernandez, 等. TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering[J]. Light: Science & Applications, 2026,15(3):824-834. DOI： 10.1038/s41377-025-02172-7.

Zhou, K. J. et al. TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering. Light: Science & Applications, 15, 824-834 (2026). DOI： 10.1038/s41377-025-02172-7.

摘要

Abstract

Resonant inelastic X-ray scattering (RIXS) is a photon-in/photon-out spectroscopic technique which has become increasingly important for the condensed matter physics community. The development of the RIXS instrumentation in soft X-ray and hard X-ray range facilitated the research in 3

and 5

transition metal (TM)-based materials

respectively. However

the tender X-ray (2000–3000 eV) RIXS covering most of 4

TM-based materials severely falls behind due to the lack of high-performance energy dispersive optics. Here

we demonstrate the design and fabrication of a laterally graded multilayer grating (MLG) optics for the establishment of the tender RIXS at the I21 RIXS beamline in Diamond Light Source. The successful implementation of the MLG boosts the photon flux by more than an order of magn

itude at the Sulfur

-edge (2475 eV) and the Ru

-edge (2838 eV) in comparison to the solution of a single-layer coated grating (SLG). More importantly

MLG retains the high energy resolution of the SLG design (~10

000) and works continuously across the full range of 2000–3000 eV. It renders the I21 beamline as the very first RIXS facility in the world that covers both soft and tender X-rays (280–3000 eV) using a grating-based spectrometer for a wide range of science applications.

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references

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