Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy

Ting-Xiao Qin; En-Ming You; Mao-Xin Zhang; Peng Zheng; Xiao-Feng Huang; Song-Yuan Ding; Bing-Wei Mao; Zhong-Qun Tian

doi:10.1038/s41377-021-00524-7

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Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy

Articles

- Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy
- Light: Science & Applications Vol. 10, Issue 5, Pages: 890-897(2021)
- Affiliations：
  
  1.State Key Laboratory of Physical Chemistry of Solid Surfaces, Collaborative Innovation Center of Chemistry for Energy Materials, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, China
  2.School of Aerospace Engineering, Xiamen University, Xiamen, China
- Author bio：
  
  Song-Yuan Ding (syding@xmu.edu.cn)
  Bing-Wei Mao (bwmao@xmu.edu.cn)
- Funds：
- DOI：10.1038/s41377-021-00524-7
  CLC：
- Published：31 May 2021，
  
  Published Online：15 April 2021，
  
  Received：10 November 2020，
  
  Revised：24 March 2021，
  
  Accepted：29 March 2021
- Accepted：
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Qin, T. X. et al. Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy. Light: Science & Applications, 10, 890-897 (2021).
DOI：

Qin, T. X. et al. Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy. Light: Science & Applications, 10, 890-897 (2021). DOI： 10.1038/s41377-021-00524-7.

摘要

Abstract

Organic-inorganic halide perovskites are emerging materials for photovoltaic applications with certified power conversion efficiencies (PCEs) ov

er 25%. Generally

the microstructures of the perovskite materials are critical to the performances of PCEs. However

the role of the nanometer-sized grain boundaries (GBs) that universally existing in polycrystalline perovskite films could be benign or detrimental to solar cell performance

still remains controversial. Thus

nanometer-resolved quantification of charge carrier distribution to elucidate the role of GBs is highly desirable. Here

we employ correlative infrared-spectroscopic nanoimaging by the scattering-type scanning near-field optical microscopy with 20 nm spatial resolution and Kelvin probe force microscopy to quantify the density of electrons accumulated at the GBs in perovskite polycrystalline thin films. It is found that the electron accumulations are enhanced at the GBs and the electron density is increased from 6 × 10

−3

in the dark to 8 × 10

−3

under 10 min illumination with 532 nm light. Our results reveal that the electron accumulations are enhanced at the GBs especially under light illumination

featuring downward band bending toward the GBs

which would assist in electron-hole separation and thus be benign to the solar cell performance.

关键词

Keywords

references

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