
1.Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Pen-Tung Sah Institute of Micro-Nano Science and Technology/ Department of Physics, Xiamen University, Xiamen 361005, China
2.San'an Optoelectronics Co., Ltd., Xiamen 361005, China
3.Department of Materials Science and Engineering, Tsing Hua University, Hsinchu 30013, China
Jun Yin (jyin@xmu.edu.cn)
Jing Li (lijing@xmu.edu.cn)
Published:30 June 2021,
Published Online:31 May 2021,
Received:07 December 2020,
Revised:28 April 2021,
Accepted:10 May 2021
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Yin, J. et al. Engineered tunneling layer with enhanced impact ionization for detection improvement in graphene/silicon heterojunction photodetectors. Light: Science & Applications, 10, 1133-1142 (2021).
Yin, J. et al. Engineered tunneling layer with enhanced impact ionization for detection improvement in graphene/silicon heterojunction photodetectors. Light: Science & Applications, 10, 1133-1142 (2021). DOI: 10.1038/s41377-021-00553-2.
Here
an engineered tunneling layer enhanced photocurrent multiplication through the impact ionization effect was proposed and experimentally demonstrated on the graphene/silicon heterojunction photodetectors. With considering the suitable band structure of the insulation material and their special defect states
an atomic layer deposition (ALD) prepared wide-bandgap insulating (WBI) layer of AlN was introduced into the interface of graphene/silicon heterojunction. The promoted tunneling process from this designed structure demonstrated that can effectively help the impact ionization with photogain not only for the regular minority carriers from silicon
but also for the novel hot carries from graphene. As a result
significantly enhanced photocurrent as well as simultaneously decreased dark current about one order were accomplished in this graphene/insulation/silicon (GIS) heterojunction devices with the optimized AlN thickness of ~15 nm compared to the conventional graphene/silicon (GS) devices. Specifically
at the reverse bias of −10 V
a 3.96-A W
−1
responsivity with the photogain of ~5.8 for the peak response under 850-nm light illumination
and a 1.03-A W
−1
responsivity with ~3.5 photogain under the 365 nm ultraviolet (UV) illumination were realized
which are even remarkably higher than those in GIS devices with either Al
2
O
3
or the commonly employed SiO
2
insulation layers. This work demonstrates a universal strategy to fabricate broadband
low-cost and high-performance photo-detecting d
evices towards the graphene-silicon optoelectronic integration.
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