Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer

Jörg S. Eismann; Martin Neugebauer; Klaus Mantel; Peter Banzer

doi:10.1038/s41377-021-00663-x

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Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer

Articles

- Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
- Light: Science & Applications Vol. 10, Issue 12, Pages: 2342-2348(2021)
- Affiliations：
  
  1.Institute of Physics, University of Graz, NAWI Graz, Universitätsplatz 5, 8010 Graz, Austria
  2.Max Planck Institute for the Science of Light, Staudtstr. 2, 91058 Erlangen, Germany
  3.Institute of Optics, Information and Photonics, University Erlangen-Nuremberg, Staudtstr. 7/B2, 91058 Erlangen, Germany
- Author bio：
  
  Peter Banzer (peter.banzer@uni-graz.at)
- Funds：
- DOI：10.1038/s41377-021-00663-x
  CLC：
- Published：31 December 2021，
  
  Published Online：02 November 2021，
  
  Received：09 August 2021，
  
  Revised：08 October 2021，
  
  Accepted：14 October 2021
- Accepted：
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Eismann, J. S. et al. Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer. Light: Science & Applications, 10, 2342-2348 (2019).
DOI：

Eismann, J. S. et al. Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer. Light: Science & Applications, 10, 2342-2348 (2019). DOI： 10.1038/s41377-021-00663-x.

摘要

Abstract

Measuring the aberrations of optical systems is an essential step in the fabrication of high precision optical components. Such a characterization is usually based on comparing the device under investigation with a calibrated reference object. However

when working at the cutting-edge of technology

it is increasingly difficult to provide an even better or well-known reference device. In this manuscript we present a method for the characterization of high numerical aperture microscope objectives

functioning without the need of calibrated reference optics. The technique constitutes a nanoparticle

acting as a dipole-like scatterer

that is placed in the focal volume of the microscope objective. The light that is scattered by the particle can be measured individually and serves as the reference wave in our system. Utilizing the well-characterized scattered light as nearly perfect reference wave is the main idea behind this manuscript.

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Keywords

references

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