Terahertz near-field microscopy based on an air-plasma dynamic aperture

Xin-ke Wang; Jia-sheng Ye; Wen-feng Sun; Peng Han; Lei Hou; Yan Zhang

doi:10.1038/s41377-022-00822-8

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Terahertz near-field microscopy based on an air-plasma dynamic aperture

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- Terahertz near-field microscopy based on an air-plasma dynamic aperture
- Light: Science & Applications Vol. 11, Issue 6, Pages: 1149-1157(2022)
- Affiliations：
  
  1.Beijing Key Laboratory of Metamaterials and Devices, Key Laboratory of Terahertz Optoelectronics Ministry of Education, Department of Physics, Capital Normal University, Beijing 100048, China
  2.Applied Physics Department, Xian University of Technology, Xian, Shaanxi 710048, China
- Author bio：
  
  Yan Zhang (yzhang@cnu.edu.cn)
- Funds：
- DOI：10.1038/s41377-022-00822-8
  CLC：
- Published：30 June 2022，
  
  Published Online：07 May 2022，
  
  Received：14 December 2021，
  
  Revised：13 April 2022，
  
  Accepted：27 April 2022
- Accepted：
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Wang, X. K. et al. Terahertz near-field microscopy based on an air-plasma dynamic aperture. Light: Science & Applications, 11, 1149-1157 (2022).
DOI：

Wang, X. K. et al. Terahertz near-field microscopy based on an air-plasma dynamic aperture. Light: Science & Applications, 11, 1149-1157 (2022). DOI： 10.1038/s41377-022-00822-8.

摘要

Abstract

Terahertz (THz) near-field microscopy retains the advantages of THz radiation and realizes sub-wavelength imaging

which enables applications in fundamental research and industrial fields. In most THz near-field microscopies

the sample surface must be approached by a THz detector or source

which restricts the sample choice. Here

a technique was developed based on an air-plasma dynamic aperture

where two mutually perpendicular air-plasmas overlapped to form a cross-filament above a sample surface that modulated an incident THz beam. THz imaging with quasi sub-wavelength resolution (approximately

where

is the wavelength of the THz beam) was thus observed without approaching the sample with any devices. Damage to the sample by the air-plasmas was avoided. Near-field imaging of four different materials was achieved

including metallic

semiconductor

plastic

and greasy samples. The resolution characteristics of the near-field system were investigated with experiment and theory. The advantages of the technique are expected to accelerate the advancement of THz microscopy.

关键词

Keywords

references

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