"Metrology is a key component of the industrial value-added chain": an interview with Prof. Wolfgang Osten

Shuai Ding

doi:10.1038/s41377-022-00965-8

Go to Nature Website

Your Location：

Home >

Browse articles >

"Metrology is a key component of the industrial value-added chain": an interview with Prof. Wolfgang Osten

Light People

- "Metrology is a key component of the industrial value-added chain": an interview with Prof. Wolfgang Osten
- Light: Science & Applications Vol. 11, Issue 10, Pages: 2288-2293(2022)
- Affiliations：
  
  Light Publishing Group, Changchun Institute of Optics, Fine Mechanics, and Physics, Chinese Academy of Sciences, 3888 Dong Nan Hu Road, 130033 Changchun, China
- Author bio：
  
  Shuai Ding (dingshuai@ciomp.ac.cn)
- Funds：
- DOI：10.1038/s41377-022-00965-8
  CLC：
- Published：31 October 2022，
  
  Published Online：22 September 2022，
- Accepted：
Scan QR Code
Ding, S. “Metrology is a key component of the industrial value-added chain”: an interview with Prof. Wolfgang Osten. Light: Science & Applications, 11, 2288-2293 (2022).
DOI：

Ding, S. “Metrology is a key component of the industrial value-added chain”: an interview with Prof. Wolfgang Osten. Light: Science & Applications, 11, 2288-2293 (2022). DOI： 10.1038/s41377-022-00965-8.

摘要

Abstract

Mendeleev said: "Science begins where one begins to measure

" and "exact science is unthinkable without measure." During his more than 4-decades-long career

Prof. Wolfgang Osten has been devoted to optical metrology and inspection technologies. Osten and his research team developed the first automated system for the quantitative and qualitative evaluation of interferograms in the '80s

as well as the principle of tilted-wave interferometry for high-precision aspherical and free-form surface measurement. Both techniques have since been commercialized. His achievements have "lit the way" for research in optical metrology. The bond between Osten and Light Publishing Group can be traced back to 2012

when he first submitted a paper to

Light: Science & Applications

(LSA) as an author and published a paper

. Right after that

he was invited to join the Editorial Board for his enthusiasm. In 2019

he started the challenge of founding the new journal

Light: Advanced Manufacturing

(LAM) as the co-Editor-in-Chief. In this interview

Osten shared his insights on Optical Metrology

Holography

and the Founding of LAM with us. Follow the Q

As below and let us get closer to the "Holoknight".

关键词

Keywords

references

Paz V. Ferreras , S. Peterhänsel , K. Frenner , W. Osten . Solving the inverse grating problem by white light interference Fourier scatterometry . Light Sci. Appl. , 2012 . 1 e36 DOI:10.1038/lsa.2012.36http://doi.org/10.1038/lsa.2012.36 .

ISO/IEC GUIDE 98-3: 2008. Uncertainty of Measurement—Part 3: Guide to the Expression of Uncertainty in Measurement (GUM: 1995) https://www.iso.org/standard/50461.htmlhttps://www.iso.org/standard/50461.html (2008).

W. Osten , G. Pedrini . 55 years of holographic non-destructive testing and experimental stress analysis: is there still progress to be expected? . Light.: Adv. Manuf. , 2022 . 3 121 -136. .

Vest, C. M. Holographic NDE—Status and Future (Study for Office of Nondestructive Evaluation of the National Bureau of Standards, 1981).

B. Javidi , 等 . Roadmap on digital holography [Invited] . Opt. Express , 2021 . 29 35078 -35118 . DOI:10.1364/OE.435915http://doi.org/10.1364/OE.435915 .

Views

Downloads

CSCD

Alert me when the article has been cited

Submit

Tools

Publicity Resources

No data

Related Author

No data

Related Institution

No data

⁰