Direct high-resolution X-ray imaging exploiting pseudorandomness

KyeoReh Lee; Jun Lim; Su Yong Lee; YongKeun Park

doi:10.1038/s41377-023-01124-3

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Direct high-resolution X-ray imaging exploiting pseudorandomness

Original Articles

- Direct high-resolution X-ray imaging exploiting pseudorandomness
- Light: Science & Applications Vol. 12, Issue 5, Pages: 776-788(2023)
- Affiliations：
  
  1.Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 34141, Republic of Korea
  2.KAIST Institute for Health Science and Technology, Korea Advanced Institute of Science and Technology, Daejeon 34141, Republic of Korea
  3.Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang, Kyungbuk 37637, Republic of Korea
  4.Tomocube Inc, Daejeon 34051, Republic of Korea
- Author bio：
  
  KyeoReh Lee (kyeo@kaist.ac.kr)
  Jun Lim (limjun@postech.ac.kr)
  YongKeun Park (yk.park@kaist.ac.kr)
- Funds：
- DOI：10.1038/s41377-023-01124-3
  CLC：
- Published：31 May 2023，
  
  Published Online：6 April 2023，
  
  Received：5 July 2022，
  
  Revised：28 February 2023，
  
  Accepted：3 March 2023
Scan for full text
Lee, K. et al. Direct high-resolution X-ray imaging exploiting pseudorandomness. Light: Science & Applications, 12, 776-788 (2023).
DOI：

Lee, K. et al. Direct high-resolution X-ray imaging exploiting pseudorandomness. Light: Science & Applications, 12, 776-788 (2023). DOI： 10.1038/s41377-023-01124-3.

摘要

Abstract

Owing to its unique penetrating power and high-resolution capability

X-ray imaging has been an irreplaceable tool since its discovery. Despite the significance

the resolution of X-ray imaging has largely been limited by the technical difficulties on X-ray lens making. Various lensless imaging methods have been proposed

but are yet relying on multiple measurements or additional constraints on measurements or samples. Here we present coherent speckle-correlation imaging (CSI) using a designed X-ray diffuser. CSI has no prerequisites for samples or measurements. Instead

from a single shot measurement

the complex sample field is retrieved based on the pseudorandomness of the speckle intensity pattern

ensured through a diffuser. We achieve a spatial resolution of 13.9 nm at 5.46 keV

beating the feature size of the diffuser used (300 nm). The high-resolution imaging capability is theoretically explained based on fundamental and practical limits. We expect the CSI to be a versatile tool for navigating the unexplored world of nanometer.

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references

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