Dose-efficient scanning Compton X-ray microscopy

Tang Li; J. Lukas Dresselhaus; Nikolay Ivanov; Mauro Prasciolu; Holger Fleckenstein; Oleksandr Yefanov; Wenhui Zhang; David Pennicard; Ann-Christin Dippel; Olof Gutowski; Pablo Villanueva-Perez; Henry N. Chapman; Saša Bajt

doi:10.1038/s41377-023-01176-5

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Dose-efficient scanning Compton X-ray microscopy

Original Articles

- Dose-efficient scanning Compton X-ray microscopy
- Light: Science & Applications Vol. 12, Issue 6, Pages: 1141-1152(2023)
- Affiliations：
  
  1.The Hamburg Centre for Ultrafast Imaging, 22761 Hamburg, Germany
  2.Center for Free-Electron Laser Science CFEL, Deutsches ElektronenSynchrotron DESY, 22607 Hamburg, Germany
  3.Deutsches Elektronen Synchrotron DESY, 22607 Hamburg, Germany
  4.Synchrotron Radiation Research and NanoLund, Lund University, 221 00 Lund, Sweden
  5.Department of Physics, Universität Hamburg, 22761 Hamburg, Germany
- Author bio：
  
  Henry N. Chapman (henry.chapman@desy.de)
  Saša Bajt (sasa.bajt@desy.de)
- Funds：
- DOI：10.1038/s41377-023-01176-5
  CLC：
- Published：30 June 2023，
  
  Published Online：30 May 2023，
  
  Received：2 March 2023，
  
  Revised：28 April 2023，
  
  Accepted：5 May 2023
Scan for full text
Li, T. et al. Dose-efficient scanning Compton X-ray microscopy. Light: Science & Applications, 12, 1141-1152 (2023).
DOI：

Li, T. et al. Dose-efficient scanning Compton X-ray microscopy. Light: Science & Applications, 12, 1141-1152 (2023). DOI： 10.1038/s41377-023-01176-5.

摘要

Abstract

The highest resolution of images of soft matter and biological materials is ultimately limited by modification of the structure

induced by the necessarily high energy of short-wavelength radiation. Imaging the inelastically scattered X-rays at a photon energy of 60 keV (0.02 nm wavelength) offers greater signal per energy transferred to the sample than coherent-scattering techniques such as phase-contrast microscopy and projection holography. We present images of dried

unstained

and unfixed biological objects obtained by scanning Compton X-ray microscopy

at a resolution of about 70 nm. This microscope was realised using novel wedged multilayer Laue lenses that were fabricated to sub-ångström precision

a new wavefront measurement scheme for hard X rays

and efficient pixel-array detectors. The doses required to form these images were as little as 0.02% of the tolerable dose and 0.05% of that needed for phase-contrast imaging at similar resolution using 17 keV photon energy. The images obtained provide a quantitative map of the projected mass density in the sample

as confirmed by imaging a silicon wedge. Based on these results

we find that it should be possible to obtain radiation damage-free images of biological samples at a resolution below 10 nm.

关键词

Keywords

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