Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission

Gwiyeong Moon; Taehwang Son; Hajun Yoo; Changhun Lee; Hyunwoong Lee; Seongmin Im; Donghyun Kim

doi:10.1038/s41377-023-01237-9

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Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission

Original Articles

- Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission
- Light: Science & Applications Vol. 12, Issue 10, Pages: 2236-2247(2023)
- Affiliations：
  
  1.School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Korea
  2.Present address: LG Innotek, Seoul 07796, South Korea
  3.Present address: Center for Systems Biology, Massachusetts General Hospital, Boston, MA, USA
  4.Present address: LG Display, Paju, Gyeonggi-do 10845, South Korea
- Author bio：
  
  Donghyun Kim (kimd@yonsei.ac.kr)
- Funds：
- DOI：10.1038/s41377-023-01237-9
  CLC：
- Published：31 October 2023，
  
  Published Online：18 September 2023，
  
  Received：14 September 2022，
  
  Revised：16 July 2023，
  
  Accepted：18 July 2023
- Accepted：
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Moon, G. et al. Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission. Light: Science & Applications, 12, 2236-2247 (2023).
DOI：

Moon, G. et al. Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission. Light: Science & Applications, 12, 2236-2247 (2023). DOI： 10.1038/s41377-023-01237-9.

摘要

Abstract

Optical properties of single emitters can be significantly improved through the interaction with plasmonic structures

leading to enhanced sensing and imaging capabilities. In turn

single emitters can act as sensitive probes of the local electromagnetic field surrounding plasmonic structures

furnishing fundamental insights into their physics and guiding the design of novel plasmonic devices. However

the interaction of emitters in the proximity to a plasmonic nanostructure causes distortion

which hinders precise estimation of position and polarization state and is one of the reasons why detection and quantification of molecular processes yet remain fundamentally challenging in this era of super-resolution. Here

we investigate axially defocused images of a single fluorescent emitter near metallic nanostructure

which encode emitter positions and can be acquired in the far-field with high sensitivity

while analyzing the images with pattern matching algorithm to explore emitter-localized surface plasmon interaction and retrieve information regarding emitter positions. Significant distortion in defocused images of fluorescent beads and quantum dots near nanostructure was observed and analyzed by pattern matching and finite-difference time-domain methods

which revealed that the distortion arises from the emitter interaction with nanostructure. Pattern matching algorithm was also adopted to estimate the lateral positions of a dipole that models an emitter utilizing the distorted defocused images and achieved improvement by more than 3 times over conventional diffraction-limited localization methods. The improvement by defocused imaging is expected to provide a way of enhancing reliability when using plasmonic nanostructure and diversifying strategies for various imaging and sensing modalities.

关键词

Keywords

references

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