
1.Hyperspectral Nano-imaging Team, Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea
2.Department of Aerospace Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA
3.Multiscale Mechanical Properties Measurement Team, Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea
4.School of Mechanical Engineering, Chonnam National University, Gwangju 61186, Republic of Korea
5.School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Republic of Korea
6.Functional Composite Materials Research Center, Korea Institute of Science and Technology, Jeonbuk 55324, Republic of Korea
7.SKKU Advanced Institute of Nanotechnology, Sungkyunkwan University, Suwon 16419, Republic of Korea
8.Division of Nano & Information Technology, KIST School, University of Science and Technology, Seoul 02792, Republic of Korea
Junghoon Jahng (phyjjh@kriss.re.kr)
Eun Seong Lee (eslee@kriss.re.kr)
Published:31 December 2023,
Published Online:24 November 2023,
Received:09 May 2023,
Revised:29 September 2023,
Accepted:30 October 2023
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Jahng, J. et al. Characterizing and controlling infrared phonon anomaly of bilayer graphene in optical-electrical force nanoscopy. Light: Science & Applications, 12, 2700-2710 (2023).
Jahng, J. et al. Characterizing and controlling infrared phonon anomaly of bilayer graphene in optical-electrical force nanoscopy. Light: Science & Applications, 12, 2700-2710 (2023). DOI: 10.1038/s41377-023-01320-1.
We
for the first time
report the nanoscopic imaging study of anomalous infrared (IR) phonon enhancement of bilayer graphene
originated from the charge imbalance between the top and bottom layers
resulting in the enhancement of E
1u
mode of bilayer graphene near 0.2 eV. We modified the multifrequency atomic force microscope platform to combine photo-induced force microscope with electrostatic/Kelvin probe force microscope constituting a novel hybrid nanoscale optical-electrical force imaging system. This enables to observe a correlation between the IR response
doping level
and topographic information of the graphene layers. Through the nanoscale spectroscopic image measurements
we demonstrate that the charge imbalance at the graphene interface can be controlled by chemical (doping effect via Redox mechanism) and mechanical (triboelectric effect by the doped cantilever) approaches. Moreover
we can also diagnosis the subsurface cracks on the stacked few-layer graphene at nanoscale
by monitoring the strain-induced IR phonon shift. Our approach provides new insights into the development of graphene-based electronic and photonic devices and their potential applications.
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