Observing charge separation in nanoantennas via ultrafast point-projection electron microscopy

Jan Vogelsang; Germann Hergert; Dong Wang; Petra Groß; Christoph Lienau

doi:10.1038/s41377-018-0054-5

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Observing charge separation in nanoantennas via ultrafast point-projection electron microscopy

Letter

- Observing charge separation in nanoantennas via ultrafast point-projection electron microscopy
- Observing charge separation in nanoantennas via ultrafast point-projection electron microscopy
- 光：科学与应用 2018年7卷第5期页码：317-324
- Affiliations：
  
  1.Carl von Ossietzky Universität, Institut für Physik and Center of Interface Science, 26129, Oldenburg, Niedersachsen, Germany
  2.TU Ilmenau, Institut für Werkstofftechnik und Institut für Mikro- und Nanotechnologien, 98693, Ilmenau, Thüringen, Germany
  3.Carl von Ossietzky Universität, Forschungszentrum Neurosensorik, 26129, Oldenburg, Niedersachsen, Germany
  4.Present address: Department of Physics, Lund University, Box 118, 221 00 Lund, Sweden
- Author bio：
  
  Jan Vogelsang (jan.vogelsang@uni-oldenburg.de)
  Jan Vogelsang (jan.vogelsang@uni-oldenburg.de)
- Funds：
- DOI：10.1038/s41377-018-0054-5
  中图分类号：
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Jan Vogelsang, Germann Hergert, Dong Wang, 等. Observing charge separation in nanoantennas via ultrafast point-projection electron microscopy[J]. 光：科学与应用, 2018,7(5):317-324.

Vogelsang, J. et al. Observing charge separation in nanoantennas via ultrafast point-projection electron microscopy. Light: Science & Applications, 7, 317-324 (2018).
Jan Vogelsang, Germann Hergert, Dong Wang, 等. Observing charge separation in nanoantennas via ultrafast point-projection electron microscopy[J]. 光：科学与应用, 2018,7(5):317-324. DOI： 10.1038/s41377-018-0054-5.

Vogelsang, J. et al. Observing charge separation in nanoantennas via ultrafast point-projection electron microscopy. Light: Science & Applications, 7, 317-324 (2018). DOI： 10.1038/s41377-018-0054-5.

摘要

Abstract

Observing the motion of electrons on their natural nanometer length and femtosecond time scales is a fundamental goal of and an open challenge for contemporary ultrafast science,1,1,-,5,5,1-5,. At present, optical techniques and electron microscopy mostly provide either ultrahigh temporal or spatial resolution, and microscopy techniques with combined space-time resolution require further development,6,6,-,11,11,6-11,. In this study, we create an ultrafast electron source via plasmon nanofocusing on a sharp gold taper and implement this source in an ultrafast point-projection electron microscope. This source is used in an optical pump—electron probe experiment to study ultrafast photoemissions from a nanometer-sized plasmonic antenna,12,12,-,15,15,12-15,. We probe the real space motion of the photoemitted electrons with a 20-nm spatial resolution and a 25-fs time resolution and reveal the deflection of probe electrons by residual holes in the metal. This is a step toward time-resolved microscopy of electronic motion in nanostructures.

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references

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