Generalized laws of refraction and reflection at interfaces between different photonic artificial gauge fields

Moshe-Ishay Cohen; Christina Jörg; Yaakov Lumer; Yonatan Plotnik; Erik H. Waller; Julian Schulz; Georg von Freymann; Mordechai Segev

doi:10.1038/s41377-020-00411-7

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Generalized laws of refraction and reflection at interfaces between different photonic artificial gauge fields

Original Articles

- Generalized laws of refraction and reflection at interfaces between different photonic artificial gauge fields
- Generalized laws of refraction and reflection at interfaces between different photonic artificial gauge fields
- LSA 2020年9卷第6期页码：1830-1840
- Affiliations：
  
  1.Physics Department, Technion—Israel Institute of Technology, Haifa 32000, Israel
  2.Solid State Institute, Technion—Israel Institute of Technology, Haifa 32000, Israel
  3.Physics Department and Research Center OPTIMAS, TU Kaiserslautern, 67663 Kaiserslautern, Germany
  4.Department of Physics, The Pennsylvania State University, State College, PA 16802, USA
  5.Fraunhofer Institute for Industrial Mathematics ITWM, 67663 Kaiserslautern, Germany
- Author bio：
  
  Mordechai Segev (msegev@technion.ac.il)
- Funds：
- DOI：10.1038/s41377-020-00411-7
  中图分类号：
- 纸质出版日期：2020，
  
  网络出版日期：2020-12-22，
  
  收稿日期：2020-05-28，
  
  修回日期：2020-09-14，
  
  录用日期：2020-09-14
- Accepted：
Scan QR Code
Generalized laws of refraction and reflection at interfaces between different photonic artificial gauge fields[J]. LSA, 2020,9(6):1830-1840.

Cohen, M. I. et al. Generalized laws of refraction and reflection at interfaces between different photonic artificial gauge fields. Light: Science & Applications, 9, 1830-1840 (2020).
Generalized laws of refraction and reflection at interfaces between different photonic artificial gauge fields[J]. LSA, 2020,9(6):1830-1840. DOI： 10.1038/s41377-020-00411-7.

Cohen, M. I. et al. Generalized laws of refraction and reflection at interfaces between different photonic artificial gauge fields. Light: Science & Applications, 9, 1830-1840 (2020). DOI： 10.1038/s41377-020-00411-7.

摘要

Abstract

Artificial gauge fields the control over the dynamics of uncharged particles by engineering the potential landscape such that the particles behave as if effective external fields are acting on them. Recent years have witnessed a growing interest in artificial gauge fields generated either by the geometry or by time-dependent modulation

as they have been enablers of topological phenomena and synthetic dimensions in many physical settings

e.g.

photonics

cold atoms

and acoustic waves. Here

we formulate and experimentally demonstrate the generalized laws of refraction and reflection at an interface between two regions with different artificial gauge fields. We use the symmetries in the system to obtain the generalized Snell law for such a gauge interface and solve for reflection and transmission. We identify total internal reflection (TIR) and complete transmission and demonstrate the concept in experiments. In addition

we calculate the artificial magnetic flux at the interface of two regions with different artificial gauge fields and present a method to concatenate several gauge interfaces. As an example

we propose a scheme to make a gauge imaging system—a device that can reconstruct (image) the shape of an arbitrary wavepacket launched from a certain position to a predesigned location.

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