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Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy
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    • Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy

    • Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy

    • LSA   2021年10卷第5期 页码:890-897
    • DOI:10.1038/s41377-021-00524-7    

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    • 纸质出版日期:2021-05-31,

      网络出版日期:2021-04-15,

      收稿日期:2020-11-10,

      修回日期:2021-03-24,

      录用日期:2021-03-29

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  • Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy[J]. LSA, 2021,10(5):890-897. DOI: 10.1038/s41377-021-00524-7.

    Qin, T. X. et al. Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy. Light: Science & Applications, 10, 890-897 (2021). DOI: 10.1038/s41377-021-00524-7.

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