1.Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139, USA
2.Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, USA
3.Argonne National Laboratory, Lemont, IL 60439, USA
4.Singapore-MIT Alliance for Research and Technology (SMART) Centre, 1 CREATE Way, Singapore 138602, Singapore
5.Present address: Department of Molecular and Cell Biology, University of California, Berkeley, CA 94720, USA
6.Present address: Singapore-MIT Alliance for Research and Technology (SMART) Centre, 1 CREATE Way, Singapore 138602, Singapore
7.Present address: Center for Transformative Science, ShanghaiTech University, 201210 Shanghai, China
George Barbastathis (gbarb@mit.edu)
纸质出版日期:2023-6-30,
网络出版日期:2023-5-30,
收稿日期:2023-1-16,
修回日期:2023-5-9,
录用日期:2023-5-10
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Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time[J]. 光:科学与应用, 2023,12(6):1127-1140.
Kang, I. et al. Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time. Light: Science & Applications, 12, 1127-1140 (2023).
Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time[J]. 光:科学与应用, 2023,12(6):1127-1140. DOI: 10.1038/s41377-023-01181-8.
Kang, I. et al. Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time. Light: Science & Applications, 12, 1127-1140 (2023). DOI: 10.1038/s41377-023-01181-8.
Noninvasive X-ray imaging of nanoscale three-dimensional objects
such as integrated circuits (ICs)
generally requires two types of scanning: ptychographic
which is translational and returns estimates of the complex electromagnetic field through the IC; combined with a tomographic scan
which collects these complex field projections from multiple angles. Here
we present Attentional Ptycho-Tomography (APT)
an approach to drastically reduce the amount of angular scanning
and thus the total acquisition time. APT is machine learning-based
utilizing axial self-Attention for Ptycho-Tomographic reconstruction. APT is trained to obtain accurate reconstructions of the ICs
despite the incompleteness of the measurements. The training process includes regularizing priors in the form of typical patterns found in IC interiors
and the physics of X-ray propagation through the IC. We show that APT with ×12 reduced angles achieves fidelity comparable to the gold standard Simultaneous Algebraic Reconstruction Technique (SART) with the original set of angles. When using the same set of reduced angles
then APT also outperforms Filtered Back Projection (FBP)
Simultaneous Iterative Reconstruction Technique (SIRT) and SART. The time needed to compute the reconstruction is also reduced
because the trained neural network is a forward operation
unlike the iterative nature of these alternatives. Our experiments show that
without loss in quality
for a 4.48 × 93.2 × 3.92 µm
3
IC (
$$\simeq $$
6 × 10
8
voxels)
APT reduces the total data acquisition and computation time from 67.96 h to 38 min. We expect our physics-assisted and attention-utilizing machine learning framework to be applicable to other branches of nanoscale imaging
including materials science and biological imaging.
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